Delphin Technology AG now offer a new customisable measurement case. Based on the high-speed Expert Logger series, it comes with an integrated OPC UA interface. The measurement case combines two important applications, making it a highly practical device for many manufacturing operations. On one hand, the measurement case is able to acquire energy consumption data, perform accounting tasks and store data. On the other hand, it can be used to analyse faults in machines and process signals. Additionally the mobile measurement case is available in a range of different configurations.
Energy Monitoring Applications
For energy monitoring applications, the case can be equipped with up to 3 independent measurement circuits to measure power. This enables the energy consumption of several machines to undergo simultaneous accounting. Depending on customer requirements, power measurement units can be used to various data. These include measurements such as real, reactive, and apparent power, as well as voltages, currents and power factors (cos phi). Current / voltage converters can also be used to acquire peak values or to analyse networks for diagnosis purposes. The case has eight synchronous digital / frequency inputs for acquiring energy-meter or flow readings. Electrical connection is via pluggable screw terminals or special connectors according to specific customer requirements.
Additionally, the case also offers up to 46 analogue inputs and 48 digital inputs for fault analysis. Sampling rates range from 20 µsec up to hours – or daily average rates.
All measurement data and energy consumption information can be independently stored within the measurement case. An internal data storage capability offers space for up to approximately 500 million measurement values. This includes high-precision time stamping. The case is also equipped with an OPC UA interface and can transfer measurement data directly to the cloud. The extensive ProfiSignal Go software is included in delivery. This software enables evaluation using a range of different diagrams portraying data from a µsec resolution up to annual overviews.
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